RTL-aware dataflow-driven macro placement

© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.When RTL designers define the hierarchy of a system, they exploit their knowledge about the conceptual abstractions devised during the design and the functional interactions between the logical components. This valuable information is often lost during physical synthesis. This paper proposes a novel multi-level approach for the macro placement problem of complex designs dominated by macro blocks, typically memories. By taking advantage of the hierarchy tree, the netlist is divided into blocks containing macros and standard cells, and their dataflow affinity is inferred considering the latency and flow width of their interaction. The layout is represented using slicing structures and generated with a top-down algorithm capable of handling blocks with both hard and soft components, aimed at wirelength minimization. These techniques have been applied to a set of large industrial circuits and compared against both a commercial floorplanner and handcrafted floorplans by expert back-end engineers. The proposed approach outperforms the commercial tool and produces solutions with similar quality to the best handcrafted floorplans. Therefore, the generated floorplans provide an excellent starting point for the physical design iterations and contribute to reduce turn-around time significantly.Peer ReviewedPostprint (author's final draft

Error probability in synchronous digital circuits due to power supply noise

This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered gives the timing violation error probability as a new design quality factor in front of conventional techniques that assume the full perfection of the circuit. The evaluation of the error bound can be useful for new design paradigms where retry and self-recovering techniques are being applied to the design of high performance processors. The method here described allows to evaluate the performance of these techniques by means of calculating the expected error probability in terms of power supply distribution quality.Postprint (published version

Error probability in synchronous digital circuits due to power supply noise

This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered gives the timing violation error probability as a new design quality factor in front of conventional techniques that assume the full perfection of the circuit. The evaluation of the error bound can be useful for new design paradigms where retry and self-recovering techniques are being applied to the design of high performance processors. The method here described allows to evaluate the performance of these techniques by means of calculating the expected error probability in terms of power supply distribution quality.Peer Reviewe

Voltage fluctuations in IC power supply distribution

The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research works on the area assume that all the nodes of the chip are fed at the same voltage, in such a way that the main cause of disturbance or fluctuation is the parasitic impedance of packaging. In the paper an approach to analyze the effect of high and fast current demands on the on-chip power supply network. First an approach to model the entire network by considering a homogeneous conductive foil is presented. The modification of the timing parameters of flipflops caused by spatial voltage drops through the IC surface are also investigated.Peer Reviewe

Power supply noise and logic error probability

Voltage fluctuations caused by parasitic impedances in the power supply rails of modern ICs are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse nodes of the internal sections causing two effects: a degradation of performances mainly impacting gate delays and a noisy contamination of the quiescent levels of the logic that drives the node. Both effects are presented together, in this paper, showing than both are a cause of errors in modern and future digital circuits. The paper groups both error mechanisms and shows how the global error rate is related with the voltage deviation and the period of the clock of the digital system.Peer Reviewe

Error probability in synchronous digital circuits due to power supply noise

This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered gives the timing violation error probability as a new design quality factor in front of conventional techniques that assume the full perfection of the circuit. The evaluation of the error bound can be useful for new design paradigms where retry and self-recovering techniques are being applied to the design of high performance processors. The method here described allows to evaluate the performance of these techniques by means of calculating the expected error probability in terms of power supply distribution quality.Peer Reviewe

Voltage fluctuations in IC power supply distribution

The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research works on the area assume that all the nodes of the chip are fed at the same voltage, in such a way that the main cause of disturbance or fluctuation is the parasitic impedance of packaging. In the paper an approach to analyze the effect of high and fast current demands on the on-chip power supply network. First an approach to model the entire network by considering a homogeneous conductive foil is presented. The modification of the timing parameters of flipflops caused by spatial voltage drops through the IC surface are also investigated.Peer Reviewe

Error probability in synchronous digital circuits due to power supply noise

This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered gives the timing violation error probability as a new design quality factor in front of conventional techniques that assume the full perfection of the circuit. The evaluation of the error bound can be useful for new design paradigms where retry and self-recovering techniques are being applied to the design of high performance processors. The method here described allows to evaluate the performance of these techniques by means of calculating the expected error probability in terms of power supply distribution quality.Peer Reviewe

Multi-level dataflow-driven macro placement guided by RTL structure and analytical methods

When RTL designers define the hierarchy of a system, they exploit their knowledge about the conceptual abstractions devised during the design and the functional interactions between the logical components. This valuable information is often lost during physical synthesis. This paper proposes HiDaP, a novel multi-level algorithm that uses RTL information and analytical methods for the macro placement problem of modern designs dominated by multi-cycle connection pipelines. By taking advantage of the hierarchy tree, the netlist is divided into blocks containing macros and standard cells, and their dataflow affinity is inferred considering the register latency and flow width of their interaction. The layout is represented using slicing structures and generated with a top-down algorithm capable of handling blocks with both hard and soft components. An adaptive multi-objective cost function is used to simultaneously minimize wirelength, timing, overlap and distance to preferred locations, which can be user-defined or generated by analytic methods (spectral and force-directed). These techniques have been applied to a set of large industrial circuits and compared against state-of-theart commercial and academic placers, and also to handcrafted floorplans generated by expert back-end engineers. The proposed approach outperforms previous algorithmic methods and can produce solutions with better wirelength and timing than the best handcrafted floorplans. Post-routing layouts are almost brought to timing closure and DRC cleanness with minimal engineer modification, showing that the generated floorplans provide an excellent starting point for the physical design flow and contribute to reduce turn-around time significantly.This work has been partially supported by a grant from Inphi Corporation and funds from the Spanish Ministry for Economy and Competitiveness and the European Union (FEDER funds) under grant TIN2017-86727-C2-1-R, and the Generalitat de Catalunya (2017 SGR 786).Peer ReviewedPostprint (author's final draft

RTL-aware dataflow-driven macro placement

© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.When RTL designers define the hierarchy of a system, they exploit their knowledge about the conceptual abstractions devised during the design and the functional interactions between the logical components. This valuable information is often lost during physical synthesis. This paper proposes a novel multi-level approach for the macro placement problem of complex designs dominated by macro blocks, typically memories. By taking advantage of the hierarchy tree, the netlist is divided into blocks containing macros and standard cells, and their dataflow affinity is inferred considering the latency and flow width of their interaction. The layout is represented using slicing structures and generated with a top-down algorithm capable of handling blocks with both hard and soft components, aimed at wirelength minimization. These techniques have been applied to a set of large industrial circuits and compared against both a commercial floorplanner and handcrafted floorplans by expert back-end engineers. The proposed approach outperforms the commercial tool and produces solutions with similar quality to the best handcrafted floorplans. Therefore, the generated floorplans provide an excellent starting point for the physical design iterations and contribute to reduce turn-around time significantly.Peer Reviewe